Quality Engineering & Nano Validation

EverFab’s combination of manufacturing and validation systems enable our customers to confidently bring their product to the market and give them an edge above their competition.

Not only can we manufacture any part made out of any material, we can also validate and document our results. Our top of the line vision systems allow us to precisely measure parts as well as internal or external features (such as holes or shapes) to the nearest nanometer, or the nearest 0.00000003937 inches.

Our customers represent a variety of industries, and are constantly increasing their demand for smaller, more precise components. That’s why at EverFab, we have the systems to validate to the nanometer level. Utilizing our state of the art vision systems ensures that we will be able to meet your parts’ specifications, validate them, and provide supporting documentation. This non–contact method of validation minimizes the exposure to damage during the inspection process.

Optical 3D Surface Metrology:

Focus variation offers the functionalities of a micro coordinate measurement machine with those of a surface metrology system. This allows EverFab to acquire full surface characteristics since, even across large measurement areas and volumes, both form and roughness are measured with only one system.

Using infinite focus, small micro precision parts are easily measured as micro and nano structures on larger components. This technology is used for investigating tribological processes as well as corrosion and many other form and roughness measurements.

Where measurement and reverse engineering are part of EverFab’s quality assurance. 3D data can also be processed with CAD for these types of applications.

When components are below 100 um, traditional tactile methods are no longer suitable. The deeper and smaller the recesses produced by drills, end mills and other micro machining techniques are the types of features that can adequately measured. EverFab’s hybrid manufacturing methods now use an optical technology that starts measuring where other technologies have already reached their limits.